George E. P. Box

Alberto Luceño

Maria del Carmen Paniagua-Quinones

Praise for the First Edition "This book . . . is a significant addition to the literature onstatistical practice . . . should be of considerable interest tothose interested in these topics."—International Journal ofForecasting Recent research has shown that monitoring techniques alone areinadequate for modern Statistical Process Control (SPC), and thereexists a need for these techniques to be augmented by methods thatindicate when occasional process adjustment is necessary.Statistical Control by Monitoring and Adjustment, Second Editionpresents the relationship among these concepts and elementary ideasfrom Engineering Process Control (EPC), demonstrating how thepowerful synergistic association between SPC and EPC can solvenumerous problems that are frequently encountered in processmonitoring and adjustment. The book begins with a discussion of SPC as it was originallyconceived by Dr. Walter A. Shewhart and Dr. W. Edwards Deming.Subsequent chapters outline the basics of the new integration ofSPC and EPC, which is not available in other related books.Thorough coverage of time series analysis for forecasting, processdynamics, and non-stationary models is also provided, and thesesections have been carefully written so as to require only anelementary understanding of mathematics. Extensive graphicalexplanations and computational tables accompany the numerousexamples that are provided throughout each chapter, and a helpfulselection of problems and solutions further facilitatesunderstanding. Statistical Control by Monitoring and Adjustment, Second Editionis an excellent book for courses on applied statistics andindustrial engineering at the upper-undergraduate and graduatelevels. It also serves as a valuable reference for statisticiansand quality control practitioners working in industry.

Alberto Luceño

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