Bernd O. Kolbesen

Their Impact and Control in Device Manufacturing IV, DECON 2005 : Proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France

Crystalline Defects and Contamination

Electrochemical Society. Electronics Division

Society of Photo-optical Instrumentation Engineers

.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

Joint Proceedings of Symposia On: ALTEC 2003 : Analytical Techniques for Semiconductor Materials and Process Characterization IV : Paris, France ; and the 202nd Meeting of the Electrochemical Society : Diagnostic Techniques for Semiconductor Materials and Devices VI : Salt Lake City, Utah

Bernd O. Kolbesen

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