Franco Pavese

Markus Bär

Jean-Rémy Filtz

Alistair B Forbes

Leslie Pendrill

Katsuhiro Shirono

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards. Contents:Recommended Tools for Sensitivity Analysis Associated to the Evaluation of Measurement Uncertainty (A Allard and N Fischer)Case Study of Likelihood and Bayes Approaches for Measurement Based on Nonlinear Regression (A Bariska and R Bürgin)Uncertainty Modeling in 3D SEM Stereophotogrammetry (L Carli, M Galetto and G Genta)Software to Support the Use of GUM Supplement 2 — Extension to Any Number of Output Quantities (M G Cox, P M Harris and I M Smith)Probabilistic Characterization of Face Measurement (F Crenna, G B Rossi and L Bovio)Modeling Expert Knowledge to Assign Consensus Values in Proficiency Tests (S Demeyer and N Fischer)A Two-Stage MCM/MCMC Algorithm for Uncertainty Evaluation (A B Forbes)Data Fusion Techniques for Cylindrical Surface Measurements (M Galovska, R Tutsch and O Jusko)Stochastic Modeling Aspects for an Improved Solution of the Inverse Problem in Scatterometry (H Gross, M-A Henn, A Rathsfeld and M Bär)On the Difference of Meanings of “Zero Correction”: Zero Value Versus No Correction, and of the Associated Uncertainties (F Pavese)Uncertainty & Risks in Decision-Making in Qualitative Measurement: An Information-Theoretical Approach (L R Pendrill)Theory of AND Computation Program for Determination of the Reference Value in Key Comparisons Based on Bayesian Statistics (K Shirono, H Tanaka and K Ehara)and other papers Readership: Researchers, graduate students, academics and professionals in metrology. Keywords:Mathematics;Statistics;Modeling;Uncertainty;Metrology;Testing;Computational Tools;Measurement ScienceKey Features:Unique consolidated series of books (started in 1993) in mathematics, statistics and software specifically for metrology and testingAuthors are among the most prominent in the metrology and testing fieldsNo competing books in the same comprehensive set of fields

Katsuhiro Shirono

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