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Authors

Author

Patrick Meyrueis

Books

First European Conference on Optics Applied to Metrology, October 26-28, 1977, Strasbourg (France)
First European Conference on Optics Applied to Metrology, October 26-28, 1977, Strasbourg (France)
Dennis Gabor, Patrick Meyrueis
Micro- and Nanophotonic Technologies
Micro- and Nanophotonic Technologies
Patrick Meyrueis, Marcel Van de Voorde, Kazuaki Sakoda
Micro- and Nanophotonic Technologies
Micro- and Nanophotonic Technologies
Patrick Meyrueis, Marcel Van de Voorde, Kazuaki Sakoda
Applied Digital Optics
Applied Digital Optics
Bernard C. Kress, Patrick Meyrueis

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