Detection and Delineation of Faults by Surface Resistivity Measurements
John C. Edwards, E. Martin, Lloyd Harold Banning, D. G. Kuehn, Donald I. Kurth, Ernest L. Corp, Fred N. Kissell, John E. Emmerling, Robert C. Steckley, Robert Lee Stahl, Sathit Tandanand, T. O. Llewellyn, G. V. Sullivan, Harold F. Unger, Laxman S. Sundae, Richard J. Seibel, Robert L. Schuster, S. E. Khalafalla, William C. Larson, Clifford W. Schultz, Dennis V. D'Andrea, L. M. Chanin, Michael M. McDonald
